Michael C. Cao, Jonathan Schwartz, Huihuo Zheng, Yi Jiang, Robert Hovden, Yimo Han. Atomic Defect Identification with Sparse Sampling and Deep Learning. In Jeffrey Nichols, Arthur Barney Maccabe, James J. Nutaro, Swaroop Pophale, Pravallika Devineni, Theresa Ahearn, Becky Verastegui, editors, Driving Scientific and Engineering Discoveries Through the Integration of Experiment, Big Data, and Modeling and Simulation - 21st Smoky Mountains Computational Sciences and Engineering, SMC 2021, Virtual Event, October 18-20, 2021, Revised Selected Papers. Volume 1512 of Communications in Computer and Information Science, pages 455-463, Springer, 2021. [doi]
Abstract is missing.