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Raster Scan Multi-Frequency Near-Field Antenna Characterization

Amedeo Capozzoli, Claudio Curcio, Angelo Liseno. Raster Scan Multi-Frequency Near-Field Antenna Characterization. In 5th IEEE International Symposium on Measurements & Networking, M&N 2019, Catania, Italy, July 8-10, 2019. pages 1-5, IEEE, 2019. [doi]

Authors

Amedeo Capozzoli

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Claudio Curcio

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Angelo Liseno

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