Amedeo Capozzoli, Claudio Curcio, Angelo Liseno. Raster Scan Multi-Frequency Near-Field Antenna Characterization. In 5th IEEE International Symposium on Measurements & Networking, M&N 2019, Catania, Italy, July 8-10, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{CapozzoliCL19,
title = {Raster Scan Multi-Frequency Near-Field Antenna Characterization},
author = {Amedeo Capozzoli and Claudio Curcio and Angelo Liseno},
year = {2019},
doi = {10.1109/IWMN.2019.8805041},
url = {https://doi.org/10.1109/IWMN.2019.8805041},
researchr = {https://researchr.org/publication/CapozzoliCL19},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {5th IEEE International Symposium on Measurements & Networking, M&N 2019, Catania, Italy, July 8-10, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1273-2},
}