A specimen-current branching approach for FA of long Electromigration test lines

C. Caprile, I. De Munari, M. Improntac, Simona Podda, A. Scorzoni, Massimo Vanzi. A specimen-current branching approach for FA of long Electromigration test lines. Microelectronics Reliability, 42(9-11):1715-1718, 2002. [doi]

Abstract

Abstract is missing.