Investigation and modeling of stressed thermal oxides

Domenico Caputo, Fernanda Irrera. Investigation and modeling of stressed thermal oxides. Microelectronics Reliability, 42(3):327-333, 2002. [doi]

Authors

Domenico Caputo

This author has not been identified. Look up 'Domenico Caputo' in Google

Fernanda Irrera

This author has not been identified. Look up 'Fernanda Irrera' in Google