Domenico Caputo, Fernanda Irrera. Investigation and modeling of stressed thermal oxides. Microelectronics Reliability, 42(3):327-333, 2002. [doi]
@article{CaputoI02,
title = {Investigation and modeling of stressed thermal oxides},
author = {Domenico Caputo and Fernanda Irrera},
year = {2002},
doi = {10.1016/S0026-2714(01)00257-8},
url = {http://dx.doi.org/10.1016/S0026-2714(01)00257-8},
tags = {modeling},
researchr = {https://researchr.org/publication/CaputoI02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {3},
pages = {327-333},
}