Clemente Cárdenas, Javier Olmos, David García, Enrique Baeyens. Modelling, supervision and diagnosis of a manufacturing cell. In Proceedings of 9th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2003, September 16-19, 2003, Lisbon, Portugal - Volume 1. pages 69-74, IEEE, 2003. [doi]
@inproceedings{CardenasOGB03,
title = {Modelling, supervision and diagnosis of a manufacturing cell},
author = {Clemente Cárdenas and Javier Olmos and David García and Enrique Baeyens},
year = {2003},
doi = {10.1109/ETFA.2003.1247689},
url = {http://dx.doi.org/10.1109/ETFA.2003.1247689},
researchr = {https://researchr.org/publication/CardenasOGB03},
cites = {0},
citedby = {0},
pages = {69-74},
booktitle = {Proceedings of 9th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2003, September 16-19, 2003, Lisbon, Portugal - Volume 1},
publisher = {IEEE},
isbn = {0-7803-7937-3},
}