Joan Carletta, Christos A. Papachristou. Testability analysis and insertion for RTL circuits based on pseudorandom BIST. In 1995 International Conference on Computer Design (ICCD 95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings. pages 162-167, IEEE Computer Society, 1995. [doi]
@inproceedings{CarlettaP95,
title = {Testability analysis and insertion for RTL circuits based on pseudorandom BIST},
author = {Joan Carletta and Christos A. Papachristou},
year = {1995},
url = {http://computer.org/proceedings/iccd/7165/71650162abs.htm},
tags = {rule-based, testing, analysis},
researchr = {https://researchr.org/publication/CarlettaP95},
cites = {0},
citedby = {0},
pages = {162-167},
booktitle = {1995 International Conference on Computer Design (ICCD 95), VLSI in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-8186-7165-3},
}