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EDACs and test integration strategies for NAND flash memories

Stefano Di Carlo, Michele Fabiano, Roberto Piazza, Paolo Prinetto. EDACs and test integration strategies for NAND flash memories. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010. pages 218-221, IEEE, 2010. [doi]

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Stefano Di Carlo

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Michele Fabiano

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Roberto Piazza

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Paolo Prinetto

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