Test pattern generator for hybrid testing of combinational circuits - researchr publication authors

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Davide De Caro, Nicola Mazzocca, Ettore Napoli, Giacinto P. Saggese, Antonio G. M. Strollo. Test pattern generator for hybrid testing of combinational circuits. In Proceedings of the 2001 8th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2001, Malta, September 2-5, 2001. pages 745-748, IEEE, 2001. [doi]

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