High performance 7.4-micron interline transfer CCD platform for applied imaging markets

Douglas A. Carpenter, James A. DiBella, Robert Kaser, Brent Kecskemety, Stephen L. Kosman, John P. McCarten, Christopher Parks. High performance 7.4-micron interline transfer CCD platform for applied imaging markets. In Ralf Widenhorn, Antoine Dupret, editors, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV, Burlingame, California, USA, February 3-7, 2013. Volume 8659 of SPIE Proceedings, pages 865908, SPIE, 2013. [doi]

Abstract

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