TI-BIST: a temperature independent analog BIST for switched-capacitor filters

Luigi Carro, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs, Michel Renovell. TI-BIST: a temperature independent analog BIST for switched-capacitor filters. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 78-83, IEEE Computer Society, 2000. [doi]

Abstract

Abstract is missing.