Emanuela G. Cartaxo, Francisco G. Oliveira Neto, PatrĂcia D. L. Machado. Test case generation by means of UML sequence diagrams and labeled transition systems. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, MontrĂ©al, Canada, 7-10 October 2007. pages 1292-1297, IEEE, 2007. [doi]
Abstract is missing.