Maurizio Casalino, Luigi Sirleto, Luigi Moretti, Francesco Della Corte, Ivo Rendina. Au, Ag and Cu-silicon RCE photodetectors based on the internal photoemission effect at 1.55 micron. In Salvatore Coffa, editor, 2nd Internationa ICST Conference on Nano-Networks, Nano-Net 2007, Catania, Italy, September 24-26, 2007. pages 16, ICST/ACM, 2007. [doi]
Abstract is missing.