M. Casarsa, Gurgen Harutyunyan, Kaitlyn Chen, Ramesh Sharma, Giri Podichetty, Martin Keim, Sreejit Chakravarthy, Ramesh Tekumalla. Innovative practices on memory test practice. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1, IEEE Computer Society, 2018. [doi]
@inproceedings{CasarsaHCSPKCT18,
title = {Innovative practices on memory test practice},
author = {M. Casarsa and Gurgen Harutyunyan and Kaitlyn Chen and Ramesh Sharma and Giri Podichetty and Martin Keim and Sreejit Chakravarthy and Ramesh Tekumalla},
year = {2018},
doi = {10.1109/VTS.2018.8368624},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2018.8368624},
researchr = {https://researchr.org/publication/CasarsaHCSPKCT18},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-3774-6},
}