Nadir Casciola, Edoardo Giusto, Emanuele Dri, Daniel Oliveira 0002, Paolo Rech, Bartolomeo Montrucchio. Understanding the Impact of Cutting in Quantum Circuits Reliability to Transient Faults. In Alessandro Savino, Paolo Rech, Stefano Di Carlo, Dimitris Gizopoulos, editors, 28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Torino, Italy, September 12-14, 2022. pages 1-7, IEEE, 2022. [doi]
Abstract is missing.