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A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs

Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet. A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. Microelectronics Reliability, 47(9-11):1713-1718, 2007. [doi]

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Alberto Castellazzi

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Mauro Ciappa

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Wolfgang Fichtner

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M. Piton

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Michel Mermet-Guyennet

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