Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet. A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. Microelectronics Reliability, 47(9-11):1713-1718, 2007. [doi]
@article{CastellazziCFPM07,
title = {A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs},
author = {Alberto Castellazzi and Mauro Ciappa and Wolfgang Fichtner and M. Piton and Michel Mermet-Guyennet},
year = {2007},
doi = {10.1016/j.microrel.2007.07.035},
url = {http://dx.doi.org/10.1016/j.microrel.2007.07.035},
tags = {reliability},
researchr = {https://researchr.org/publication/CastellazziCFPM07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {9-11},
pages = {1713-1718},
}