A study of SiC Power BJT performance and robustness

Alberto Castellazzi, T. Takuno, R. Onishi, Tsuyoshi Funaki, Tsunenobu Kimoto, Takashi Hikihara. A study of SiC Power BJT performance and robustness. Microelectronics Reliability, 51(9-11):1773-1777, 2011. [doi]

Abstract

Abstract is missing.