Random impulsive scan for lidar sampling

Juan Castorena, Charles D. Creusere. Random impulsive scan for lidar sampling. In 19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012. pages 365-368, IEEE, 2012. [doi]

Abstract

Abstract is missing.