Helano de S. Castro, Jarbas A. N. da Silveira, Alexandre A. P. Coelho, Felipe G. A. e Silva, Philippe de S. Magalhaes, Otavio A. de Lima. A correction code for multiple cells upsets in memory devices for space applications. In 14th IEEE International New Circuits and Systems Conference, NEWCAS 2016, Vancouver, BC, Canada, June 26-29, 2016. pages 1-4, IEEE, 2016. [doi]
@inproceedings{CastroSCSML16,
title = {A correction code for multiple cells upsets in memory devices for space applications},
author = {Helano de S. Castro and Jarbas A. N. da Silveira and Alexandre A. P. Coelho and Felipe G. A. e Silva and Philippe de S. Magalhaes and Otavio A. de Lima},
year = {2016},
doi = {10.1109/NEWCAS.2016.7604783},
url = {http://dx.doi.org/10.1109/NEWCAS.2016.7604783},
researchr = {https://researchr.org/publication/CastroSCSML16},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {14th IEEE International New Circuits and Systems Conference, NEWCAS 2016, Vancouver, BC, Canada, June 26-29, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8900-6},
}