A robust method to identify faults in correlated sensors in machine condition monitoring - researchr publication authors

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Zehra Cataltepe, Chao Yuan, Claus Neubauer, Meltem Demirkus, Hans-Gerd Brummel. A robust method to identify faults in correlated sensors in machine condition monitoring. In 13th European Signal Processing Conference, EUSIPCO 2005, Antalya, Turkey, September 4-8, 2005. pages 1-4, IEEE, 2005. [doi]

This author has not been identified. Look up 'Zehra Cataltepe' in GoogleThis author has not been identified. Look up 'Chao Yuan' in GoogleThis author has not been identified. Look up 'Claus Neubauer' in GoogleThis author has not been identified. Look up 'Meltem Demirkus' in GoogleThis author has not been identified. Look up 'Hans-Gerd Brummel' in Google

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