Test-Cost Sensitive Classification Based on Conditioned Loss Functions

Mumin Cebe, Cigdem Gunduz Demir. Test-Cost Sensitive Classification Based on Conditioned Loss Functions. In Joost N. Kok, Jacek Koronacki, Ramon López de Mántaras, Stan Matwin, Dunja Mladenic, Andrzej Skowron, editors, Machine Learning: ECML 2007, 18th European Conference on Machine Learning, Warsaw, Poland, September 17-21, 2007, Proceedings. Volume 4701 of Lecture Notes in Computer Science, pages 551-558, Springer, 2007. [doi]

Abstract

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