Soft Errors induced by single heavy ions in Floating Gate memory arrays - researchr publication authors

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G. Cellere, Alessandro Paccagnella, A. Visconti, M. Bonanomi. Soft Errors induced by single heavy ions in Floating Gate memory arrays. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 275-284, IEEE Computer Society, 2005. [doi]

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