G. Cellere, Alessandro Paccagnella, A. Visconti, M. Bonanomi. Soft Errors induced by single heavy ions in Floating Gate memory arrays. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 275-284, IEEE Computer Society, 2005. [doi]
@inproceedings{CellerePVB05, title = {Soft Errors induced by single heavy ions in Floating Gate memory arrays}, author = {G. Cellere and Alessandro Paccagnella and A. Visconti and M. Bonanomi}, year = {2005}, doi = {10.1109/DFTVS.2005.62}, url = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.62}, researchr = {https://researchr.org/publication/CellerePVB05}, cites = {0}, citedby = {0}, pages = {275-284}, booktitle = {20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-2464-8}, }