Antonio Cerdeira, Magali Estrada, Lluís F. Marsal, Josep Pallarès, Benjamín Iñíguez. On the series resistance in staggered amorphous thin film transistors. Microelectronics Reliability, 63:325-335, 2016. [doi]
@article{CerdeiraEMPI16,
title = {On the series resistance in staggered amorphous thin film transistors},
author = {Antonio Cerdeira and Magali Estrada and Lluís F. Marsal and Josep Pallarès and Benjamín Iñíguez},
year = {2016},
doi = {10.1016/j.microrel.2016.05.005},
url = {http://dx.doi.org/10.1016/j.microrel.2016.05.005},
researchr = {https://researchr.org/publication/CerdeiraEMPI16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {63},
pages = {325-335},
}