On the series resistance in staggered amorphous thin film transistors

Antonio Cerdeira, Magali Estrada, Lluís F. Marsal, Josep Pallarès, Benjamín Iñíguez. On the series resistance in staggered amorphous thin film transistors. Microelectronics Reliability, 63:325-335, 2016. [doi]

Abstract

Abstract is missing.