H. Alperen Çetin, Eray Tüzün. Identifying key developers using artifact traceability graphs. In Leandro L. Minku, Tim Menzies, Mei Nagappan, editors, PROMISE '20: 16th International Conference on Predictive Models and Data Analytics in Software Engineering, Virtual Event, USA, November 8-9, 2020. pages 51-60, ACM, 2020. [doi]
Abstract is missing.