Evren Ceylan, F. Onur Kutlubay, Ayse Basar Bener. Software Defect Identification Using Machine Learning Techniques. In 32nd EUROMICRO Conference on Software Engineering and Advanced Applications (EUROMICRO-SEAA 2006), August 29 - September 1, 2006, Cavtat/Dubrovnik, Croatia. pages 240-247, IEEE, 2006. [doi]
Abstract is missing.