Jae-Hun Cha, Jae-Sung Jo, Seong-Jin Lim, Feel-soon Kang, Tae-Jin Kim. Comparison of Failure Rates According to Secondary Circuit Configurations of Full-Bridge Converters Using Fault-Tree Analysis. In 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.