Sang-uhn Cha, Hongil Yoon. Self-correcting check bit generator of error correction codes for memories. IEICE Electronic Express, 10(6):20130103, 2013. [doi]
@article{ChaY13,
title = {Self-correcting check bit generator of error correction codes for memories},
author = {Sang-uhn Cha and Hongil Yoon},
year = {2013},
doi = {10.1587/elex.10.20130103},
url = {http://dx.doi.org/10.1587/elex.10.20130103},
researchr = {https://researchr.org/publication/ChaY13},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {10},
number = {6},
pages = {20130103},
}