Cryogenic Characterization and Modeling of 14 nm Bulk FinFET Technology - researchr publication authors

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Asma Chabane, Mridula Prathapan, Peter Mueller, Eunjung Cha, Pier Andrea Francese, Marcel A. Kossel, Thomas Morf, Cezar Zota. Cryogenic Characterization and Modeling of 14 nm Bulk FinFET Technology. In 47th ESSCIRC 2021 - European Solid State Circuits Conference, ESSCIR 2021, Grenoble, France, September 13-22, 2021. pages 67-70, IEEE, 2021. [doi]

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