Michael Chaine, James Davis, Al Kearney. TLP analysis of 0.125 mum CMOS ESD input protection circuit. Microelectronics Reliability, 45(2):223-231, 2005. [doi]
@article{ChaineDK05,
title = {TLP analysis of 0.125 mum CMOS ESD input protection circuit},
author = {Michael Chaine and James Davis and Al Kearney},
year = {2005},
doi = {10.1016/j.microrel.2004.05.010},
url = {http://dx.doi.org/10.1016/j.microrel.2004.05.010},
tags = {analysis},
researchr = {https://researchr.org/publication/ChaineDK05},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {2},
pages = {223-231},
}