Multi-class heteroscedastic linear dimensionality reduction scheme for diagnosing process faults

Shiladitya Chakrabarti, Roozbeh Razavi-Far, Mehrdad Saif, Luis Rueda. Multi-class heteroscedastic linear dimensionality reduction scheme for diagnosing process faults. In 30th IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2017, Windsor, ON, Canada, April 30 - May 3, 2017. pages 1-4, IEEE, 2017. [doi]

Authors

Shiladitya Chakrabarti

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Roozbeh Razavi-Far

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Mehrdad Saif

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Luis Rueda

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