Shiladitya Chakrabarti, Roozbeh Razavi-Far, Mehrdad Saif, Luis Rueda. Multi-class heteroscedastic linear dimensionality reduction scheme for diagnosing process faults. In 30th IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2017, Windsor, ON, Canada, April 30 - May 3, 2017. pages 1-4, IEEE, 2017. [doi]
Abstract is missing.