Editorial

Krishnendu Chakrabarty, Massimo Alioto, Bevan M. Baas, Chirn Chye Boon, Meng-Fan Chang, Naehyuck Chang, Yao-Wen Chang, Chip-Hong Chang, Shih-Chieh Chang, Poki Chen, Masud H. Chowdhury, Pasquale Corsonello, Ibrahim Abe M. Elfadel, Said Hamdioui, Masanori Hashimoto, Tsung-Yi Ho, Houman Homayoun, Yuh-Shyan Hwang, Rajiv V. Joshi, Tanay Karnik, Mehran Mozaffari Kermani, Chulwoo Kim, Tae-Hyoung Kim, Jaydeep P. Kulkarni, Eren Kursun, Erik Larsson, Hai Helen Li, Huawei Li, Patrick Mercier, Prabhat Mishra, Makoto Nagata, Arun S. Natarajan, Koji Nii, Partha Pratim Pande, Ioannis Savidis, Mingoo Seok, Sheldon X.-D. Tan, Mark Mohammad Tehranipoor, Aida Todri-Sanial, Miroslav N. Velev, Miroslav N. Velev, Jiang Xu, Wei Zhang, Zhengya Zhang, Stacey Weber Jackson. Editorial. IEEE Trans. VLSI Syst., 25(1):1-20, 2017. [doi]