Zero-aliasing space compaction of test responses using multiple parity signatures

Krishnendu Chakrabarty, John P. Hayes. Zero-aliasing space compaction of test responses using multiple parity signatures. IEEE Trans. VLSI Syst., 6(2):309-313, 1998. [doi]

@article{ChakrabartyH98,
  title = {Zero-aliasing space compaction of test responses using multiple parity signatures},
  author = {Krishnendu Chakrabarty and John P. Hayes},
  year = {1998},
  doi = {10.1109/92.678893},
  url = {http://doi.ieeecomputersociety.org/10.1109/92.678893},
  tags = {testing},
  researchr = {https://researchr.org/publication/ChakrabartyH98},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {6},
  number = {2},
  pages = {309-313},
}