Design for Testability for Path Delay faults in Sequential Circuits

Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell. Design for Testability for Path Delay faults in Sequential Circuits. In DAC. pages 453-457, 1993. [doi]

Authors

Tapan J. Chakraborty

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Vishwani D. Agrawal

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Michael L. Bushnell

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