Anirban Chakraborty, Manaar Alam, Debdeep Mukhopadhyay. Deep Learning Based Diagnostics for Rowhammer Protection of DRAM Chips. In 28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019. pages 86-91, IEEE, 2019. [doi]
@inproceedings{ChakrabortyAM19-0,
title = {Deep Learning Based Diagnostics for Rowhammer Protection of DRAM Chips},
author = {Anirban Chakraborty and Manaar Alam and Debdeep Mukhopadhyay},
year = {2019},
doi = {10.1109/ATS47505.2019.00016},
url = {https://doi.org/10.1109/ATS47505.2019.00016},
researchr = {https://researchr.org/publication/ChakrabortyAM19-0},
cites = {0},
citedby = {0},
pages = {86-91},
booktitle = {28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019},
publisher = {IEEE},
isbn = {978-1-7281-2695-1},
}