Unified Characterization Platform for Emerging NVM Technology: Neural Network Application Benchmarking using off-the-Shelf NVM Chips

Supriya Chakraborty, Abhishek Gupta, Manan Suri. Unified Characterization Platform for Emerging NVM Technology: Neural Network Application Benchmarking using off-the-Shelf NVM Chips. In IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020. pages 1-5, IEEE, 2020. [doi]

@inproceedings{ChakrabortyGS20,
  title = {Unified Characterization Platform for Emerging NVM Technology: Neural Network Application Benchmarking using off-the-Shelf NVM Chips},
  author = {Supriya Chakraborty and Abhishek Gupta and Manan Suri},
  year = {2020},
  doi = {10.1109/ISCAS45731.2020.9180590},
  url = {https://doi.org/10.1109/ISCAS45731.2020.9180590},
  researchr = {https://researchr.org/publication/ChakrabortyGS20},
  cites = {0},
  citedby = {0},
  pages = {1-5},
  booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020},
  publisher = {IEEE},
  isbn = {978-1-7281-3320-1},
}