Leakage Power Minimization in Deep Sub-Micron Technology by Exploiting Positive Slacks of Dependent Paths - researchr publication authors

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Tuhin Subhra Chakraborty, Santanu Kundu, Deepak Agrawal, Sanjay Tanaji Shinde, Jacob Mathews, Rekha K. James. Leakage Power Minimization in Deep Sub-Micron Technology by Exploiting Positive Slacks of Dependent Paths. In Ayse Kivilcim Coskun, Martin Margala, Laleh Behjat, Jie Han, editors, Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016. pages 365-368, ACM, 2016. [doi]

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