Tuhin Subhra Chakraborty, Santanu Kundu, Deepak Agrawal, Sanjay Tanaji Shinde, Jacob Mathews, Rekha K. James. Leakage Power Minimization in Deep Sub-Micron Technology by Exploiting Positive Slacks of Dependent Paths. In Ayse Kivilcim Coskun, Martin Margala, Laleh Behjat, Jie Han, editors, Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016. pages 365-368, ACM, 2016. [doi]
@inproceedings{ChakrabortyKASM16,
title = {Leakage Power Minimization in Deep Sub-Micron Technology by Exploiting Positive Slacks of Dependent Paths},
author = {Tuhin Subhra Chakraborty and Santanu Kundu and Deepak Agrawal and Sanjay Tanaji Shinde and Jacob Mathews and Rekha K. James},
year = {2016},
doi = {10.1145/2902961.2902991},
url = {http://doi.acm.org/10.1145/2902961.2902991},
researchr = {https://researchr.org/publication/ChakrabortyKASM16},
cites = {0},
citedby = {0},
pages = {365-368},
booktitle = {Proceedings of the 26th edition on Great Lakes Symposium on VLSI, GLVLSI 2016, Boston, MA, USA, May 18-20, 2016},
editor = {Ayse Kivilcim Coskun and Martin Margala and Laleh Behjat and Jie Han},
publisher = {ACM},
isbn = {978-1-4503-4274-2},
}