Optimizing Defect Removal Efficiency by Defect Prediction using Machine Learning - researchr publication

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Krishna Chakravarty, Jagannath Singh. Optimizing Defect Removal Efficiency by Defect Prediction using Machine Learning. In OITS International Conference on Information Technology, OCIT 2022, Bhubaneswar, India, December 14-16, 2022. pages 205-210, IEEE, 2022. [doi]

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