Sreejit Chakravarty, Eric W. Savage, Eric N. Tran. Defect Coverage Analysis of Partitioned Testing. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 907-915, IEEE, 2004. [doi]
@inproceedings{ChakravartyST04,
title = {Defect Coverage Analysis of Partitioned Testing},
author = {Sreejit Chakravarty and Eric W. Savage and Eric N. Tran},
year = {2004},
doi = {10.1109/ITC.2004.56},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.56},
tags = {test coverage, testing, analysis, partitioning, coverage},
researchr = {https://researchr.org/publication/ChakravartyST04},
cites = {0},
citedby = {0},
pages = {907-915},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}