A Machine Learning-Based Reliability Assessment Model for Critical Software Systems - researchr publication authors

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Venkata U. B. Challagulla, Farokh B. Bastani, Raymond A. Paul, Wei-Tek Tsai, Yinong Chen. A Machine Learning-Based Reliability Assessment Model for Critical Software Systems. In 31st Annual International Computer Software and Applications Conference (COMPSAC 2007), 24-27 July 2007, Beijing, China. pages 79-86, IEEE Computer Society, 2007. [doi]

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