Venkata U. B. Challagulla, Farokh B. Bastani, Raymond A. Paul, Wei-Tek Tsai, Yinong Chen. A Machine Learning-Based Reliability Assessment Model for Critical Software Systems. In 31st Annual International Computer Software and Applications Conference (COMPSAC 2007), 24-27 July 2007, Beijing, China. pages 79-86, IEEE Computer Society, 2007. [doi]
@inproceedings{ChallagullaBPTC07,
title = {A Machine Learning-Based Reliability Assessment Model for Critical Software Systems},
author = {Venkata U. B. Challagulla and Farokh B. Bastani and Raymond A. Paul and Wei-Tek Tsai and Yinong Chen},
year = {2007},
doi = {10.1109/COMPSAC.2007.26},
url = {http://doi.ieeecomputersociety.org/10.1109/COMPSAC.2007.26},
tags = {rule-based, machine learning, reliability},
researchr = {https://researchr.org/publication/ChallagullaBPTC07},
cites = {0},
citedby = {0},
pages = {79-86},
booktitle = {31st Annual International Computer Software and Applications Conference (COMPSAC 2007), 24-27 July 2007, Beijing, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-2870-0},
}