Fault-Based Testing of Database Application Programs with Conceptual Data Model

W. K. Chan, S. C. Cheung, T. H. Tse. Fault-Based Testing of Database Application Programs with Conceptual Data Model. In 2005 NASA / DoD Conference on Evolvable Hardware (EH 2005), 29 June - 1 July 2005, Washington, DC, USA. pages 187-196, IEEE Computer Society, 2005. [doi]

Abstract

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