Abraham Chan, Ilir Gashi, Sathish Gopalakrishnan, Karthik Pattabiraman, Kizito Salako. The Statistical Assessment of Bayes-"sub"Optimal Binary Machine Learning Classifier Risk. In Elena Troubitsyna, David de Andrés, Friedemann Bitsch, editors, Computer Safety, Reliability, and Security - 45th International Conference, SAFECOMP 2026, Valencia, Spain, September 23-25, 2026, Proceedings. Volume 16868 of Lecture Notes in Computer Science, pages 296-311, Springer, 2026. [doi]
Abstract is missing.