Tuck Boon Chan, Andrew B. Kahng. Improved path clustering for adaptive path-delay testing. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 13-20, IEEE, 2012. [doi]
Abstract is missing.