Abraham Chan, Niranjhana Narayanan, Arpan Gujarati, Karthik Pattabiraman, Sathish Gopalakrishnan. Understanding the Resilience of Neural Network Ensembles against Faulty Training Data. In 21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021, Hainan, China, December 6-10, 2021. pages 1100-1111, IEEE, 2021. [doi]
Abstract is missing.